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SSI-WPTA01 Advanced Probe Station — catalog figure
SSI-WPTA01 Advanced Probe Station catalog figure. Figures may include labels or related components. Final supplied scope is confirmed in the quotation. Image source ↗

Materials & Semiconductor Equipment

SSI-WPTA01 Advanced Probe Station

An eight-inch-chuck probing platform for semiconductor and device measurements.

Materials characterization equipmentLaboratory & research enquiries

Share your experiment, required configuration and quantity for a quotation.

Product overview

The SSI-WPTA01 guide shows an eight-inch chuck, stereo zoom microscope, vacuum connection and a platen with capacity for up to ten micro-positioners. The frame includes vibration isolation. Specify probes, positioner quantity, electrical instruments and the intended I-V, C-V or other measurements separately; the maximum mounting capacity does not establish the supplied accessory count.

Specifications & ordering details

Use these parameters to define your requirement. The quotation confirms the exact supplied specification.

System / methodMaterials characterization equipment
Catalog modelSSI-WPTA01
Catalog featureEight-inch chuck and stereo zoom microscope
Catalog featurePlaten capacity up to ten micro-positioners
Catalog featureVibration-isolation frame and vacuum provision
Experiment or process requirementsSpecify with your requirement.
Operating range and sample / DUT dimensionsSpecify with your requirement.
Interfaces, options and included accessoriesSpecify with your requirement.

Research applications

  • Semiconductor device probing
  • I-V and C-V characterization
  • Micro-device electrical measurements

Before you order

  • Describe the samples or teaching experiments.
  • Specify the required instruments, accessories and interfaces.
  • Confirm installation, utilities and complete supplied scope.

Product documents

View the source catalog for this offering. Share your instrument model, configuration and application to request the relevant specification or material documentation.

View Research & Training Equipment Guide — page 46 ↗Download PDF

Selection questions

How do I check the instrument interface?

Share the instrument make and model, sample geometry, optical or beam path, mounting arrangement and drawings. The cell and instrument interfaces must be reviewed together.

Which experimental conditions are needed?

Specify temperature, pressure, atmosphere or electrolyte, and electrical connections. Confirm sample access, windows, fittings and accessories for the selected method.