Catalog imageMaterials & Semiconductor Equipment
SSI-DF01 Dielectric Test Fixture
A sample-holding fixture for dielectric measurements with compatible electrical instruments.
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Catalog imageMaterials & Semiconductor Equipment
SSI-F1000 High-Temperature Furnace
A furnace platform for temperature-dependent dielectric and materials measurements.
Catalog imageMaterials & Semiconductor Equipment
SSI-LN2 Variable-Temperature Cryostat
A liquid-nitrogen cryostat arrangement for low-temperature dielectric research.
Catalog imageMaterials & Semiconductor Equipment
SSI-WPTA01 Advanced Probe Station
An eight-inch-chuck probing platform for semiconductor and device measurements.
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